Crystal Lattice Parametric Identification Based on Analysis of Isosurface Configurations

被引：0

作者：

Kirsh, Dmitriy ^{[1
,2
]}

机构：

[1] Samara Natl Res Univ, Samara, Russia

[2] RAS, Image Proc Syst Inst, FSRC Crystallog & Photon RAS, Samara, Russia

来源：

2020 VI INTERNATIONAL CONFERENCE ON INFORMATION TECHNOLOGY AND NANOTECHNOLOGY (IEEE ITNT-2020) | 2020年

关键词：

pattern recognition; parametric identification; lattice systems; isosurface configuration; structural identification Bravais lattices; unit cell; RECONSTRUCTION; ALGORITHM;

D O I：

10.1109/ITNT49337.2020.9253324

中图分类号：

TP7 [遥感技术];

学科分类号：

081102 ; 0816 ; 081602 ; 083002 ; 1404 ;

摘要：

The paper deals with the approach to crystal lattice identification based on analysis of isosurface configurations. This method allows to estimate the relative positioning of nodes inside a unit cell, which, theoretically, should provide favorable conditions for the creation of identification algorithms resistant to structure distortions. The major problem of high computational complexity is solved by modifying the method using the three-dimensional periodicity of crystal lattice structures. The study of the method performed on a large base of reference lattices has confirmed its high resistance to structure distortions. In addition, the joint analysis of isosurface configurations and parameters of Bravais unit cells allowed to increase the accuracy of structural identification by an average of 13%.

引用

页数：5

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