Degradation of nonencapsulated polymer-based light-emitting diodes: Noise and morphology

被引:76
作者
Savvateev, VN
Yakimov, AV
Davidov, D
Pogreb, RM
Neumann, R
Avny, Y
机构
[1] RES INST JUDEA & SAMARIA,IL-44837 DN EPHRAIM,ISRAEL
[2] HEBREW UNIV JERUSALEM,CASALI INST APPL CHEM,IL-91904 JERUSALEM,ISRAEL
[3] HEBREW UNIV JERUSALEM,DEPT ORGAN CHEM,IL-91904 JERUSALEM,ISRAEL
关键词
D O I
10.1063/1.120332
中图分类号
O59 [应用物理学];
学科分类号
摘要
We show that the degradation of a nonencapsulated polymer-based light-emitting diode (LED) is accompanied by the appearance of strong fluctuations, - that is noise both in the radiance and in the film resistance, We demonstrate a correlation between the morphological changes which occur during the degradation process and the noise, suggesting that the sampling of noise during LED operation can be used as a very efficient tool to predict the approaching failure of LEDs in real-life applications. The morphological changes in LED degradation are essentially a two-stage process. First, there is formation of ''bubbles'' at the metal-polymer interface due to delamination of the polymer film from the metal surface. Second, carbonized areas in the form of ''black spots'' are formed, Accumulation of carbonized areas leads to short and/or open circuits and final LED failure. (C) 1997 American Institute of Physics.
引用
收藏
页码:3344 / 3346
页数:3
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