Photoluminescence enhancement through vertical stacking of defect-engineered Ge on Si quantum dots

被引:17
作者
Groiss, Heiko [1 ,2 ]
Spindlberger, Lukas [1 ]
Oberhumer, Peter [2 ]
Schaeffler, Friedrich [1 ]
Fromherz, Thomas [1 ]
Grydlik, Martyna [1 ]
Brehm, Moritz [1 ]
机构
[1] Johannes Kepler Univ Linz, Inst Semicond & Solid State Phys, Altenberger Str 69, A-4040 Linz, Austria
[2] Johannes Kepler Univ Linz, Ctr Surface & Nanoanalyt, Altenberger Str 69, A-4040 Linz, Austria
基金
奥地利科学基金会;
关键词
quantum dots; Ge ion bombardment; photoluminescence; vertical stacking; silicon germanium; STRANSKI-KRASTANOV GROWTH; SELF-ASSEMBLED ISLANDS; OPTICAL-PROPERTIES; LAYERS; CRYSTALS;
D O I
10.1088/1361-6641/aa5697
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this work, we show that the room-temperature photoluminescence intensity from Ge ion-bombarded (GIB) epitaxial Ge on Si quantum dots (QD) can be improved by their vertical stacking. We stress that the growth of GIB-QD multilayers is more demanding compared to all-crystalline epitaxial QDs, as a consequence of local amorphous regions within the GIB-QDs required during their genesis. We show that in spite of those amorphous regions, for accurately chosen growth temperatures of the Si spacer layers separating the GIB-QD layers, multiple GIB-QD layers can be stacked without detrimental break-down of epitaxial growth. Compared to a single GIB-QD layer, we observe a 650% increase in PL intensity for an eleven-layer GIB-QD stack, indicating that such multilayers are promising candidates as gain material for all-group-IV nano-photonic lasers.
引用
收藏
页数:5
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