High dielectric permittivity of Li and Ta codoped NiO ceramics

被引:55
作者
Hsiao, Yu-Jen
Chang, Yee-Shin
Fang, Te-Hua
Chai, Yin-Lai
Chung, Chao-Yu
Chang, Yen-Hwei [1 ]
机构
[1] Natl Cheng Kung Univ, Dept Mat Sci & Engn, Tainan 701, Taiwan
[2] Natl Formosa Univ, Inst Electroopt Mat Sci, Yunlin 632, Taiwan
[3] Natl Formosa Univ, Inst Mech & Electromech Engn, Yunlin 632, Taiwan
[4] Dahan Inst Technol, Dept Environm Resources Management, Hualien 971, Taiwan
[5] Epistar Corp, Shanhua 741, Tainan Cty, Taiwan
关键词
D O I
10.1088/0022-3727/40/3/026
中图分类号
O59 [应用物理学];
学科分类号
摘要
Phase evolution, microstructure and dielectric behaviour of Li and Ta codoped NiO (LTNO) ceramics were studied. The content of Ta2O5 was mainly dispersed into the grain boundaries and exists as the NiTa2O6 phase. The concentration of Ta has a remarkable effect on the dielectric properties of the LTNO ceramics. The sample with Ta = 5% has the highest dielectric constant of the three LTNO samples. The activation energy for the LTNO (Ta = 5%) sample was 0.126 eV and relaxation time was 3.51 x 10(-10) s. These correspond to the dielectric relaxation processes. The high dielectric constant response of the LTNO ceramics is due to the formation of a barrier layer between the grain boundaries. Orientational and space charge polarization contribute to the dielectric behaviour observed.
引用
收藏
页码:863 / 868
页数:6
相关论文
共 26 条
  • [1] Adams TB, 2002, ADV MATER, V14, P1321, DOI 10.1002/1521-4095(20020916)14:18<1321::AID-ADMA1321>3.0.CO
  • [2] 2-P
  • [3] Effects of lanthanum doping on the dielectric properties of Ba(Fe0.5Nb0.5)O3 ceramic
    Chung, CY
    Chang, YH
    Chen, GJ
    [J]. JOURNAL OF APPLIED PHYSICS, 2004, 96 (11) : 6624 - 6628
  • [4] Valence compensated perovskite oxide system Ca1-xLaxTi1-xCrxO3 -: Part II -: Electrical transport behavior
    Dwivedi, RK
    Kumar, D
    Parkash, O
    [J]. JOURNAL OF MATERIALS SCIENCE, 2001, 36 (15) : 3649 - 3655
  • [5] Valence compensated perovskite oxide system Ca1-xLaxTi1-xCrxO3 -: Part III -: Impedance spectroscopy
    Dwivedi, RK
    Kumar, D
    Parkash, O
    [J]. JOURNAL OF MATERIALS SCIENCE, 2001, 36 (15) : 3657 - 3665
  • [6] Double doping effect on the structural and dielectric properties of PZT ceramics
    Goel, P
    Yadav, KL
    James, AR
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2004, 37 (22) : 3174 - 3179
  • [7] Dielectric properties of CaCu3Ti4O12 based multiphased ceramics
    Guillemet-Fritsch, S
    Lebey, T
    Boulos, M
    Durand, B
    [J]. JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 2006, 26 (07) : 1245 - 1257
  • [8] Structure and dielectric relaxation properties of Na1-xLaxNb1-xCrxO3 perovskites
    Hsiao, YJ
    Chang, YH
    Fang, TH
    Chang, YS
    Chai, YL
    [J]. JOURNAL OF APPLIED PHYSICS, 2006, 99 (06)
  • [9] Dielectric relaxation property and barrier layer formation in CrNbO4 oxides
    Hsiao, Yu-Jen
    Chang, Yen-Hwei
    Fang, Te-Hua
    Chang, Yee-Shin
    Chai, Yin-Lai
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2006, 421 (1-2) : 240 - 246
  • [10] Maxwell-Wagner characterization of dielectric relaxation in Ni0.8Zn0.2Fe2O4/Sr0.5Ba0.5Nb2O6 composite
    Li, YJ
    Chen, XM
    Hou, RZ
    Tang, YH
    [J]. SOLID STATE COMMUNICATIONS, 2006, 137 (03) : 120 - 125