Reliable Power Delivery and Analysis of Power-Supply Noise During Testing in Monolithic 3D ICs

被引：0

作者：

Koneru, Abhishek ^{[1
]}

Todri-Sanial, Aida ^{[2
]}

Chakrabarty, Krishnendu ^{[1
]}

机构：

[1] Duke Univ, Dept Elect & Comp Engn, Durham, NC 27708 USA

[2] Univ Montpellier II, CNRS, LIRMM, Montpellier, France

来源：

2019 IEEE 37TH VLSI TEST SYMPOSIUM (VTS) | 2019年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Monolithic 3D (M3D) integration offers significant performance, power, and area benefits. However, the design of a reliable M3D power-delivery network (PDN) is challenging due to high power density and current demand per unit area. We propose a framework to design a reliable PDN for M3D ICs using accurate electrical and reliability models. We leverage genetic programming to explore the design space to optimize the PDN for M3D. We also analyze power-supply noise (PSN) during scan-based testing and compare it with that observed during functional operation. We quantify the impact of PSN during scan-based testing on yield loss. Our results show that the PDN obtained using the proposed approach significantly increases the reliability of at least 40% of the wire segments in the PDN. In addition, the proposed PDN design reduces the worst-case power-supply droop by 50.5% compared to a baseline PDN. The yield loss due to power-supply droop for the proposed design is also significantly lower compared to the baseline.

引用

页数：6

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