Obtaining the dielectric constant of solids from capacitance measurements with a pointer electrode

被引：6

作者：

Guadarrama-Santana, A. ^{[1
]}

Garcia-Valenzuela, A. ^{[1
]}

机构：

[1] Univ Nacl Autonoma Mexico, Ctr Ciencias Aplicadas & Desarrollo Tecnol, Mexico City 04510, DF, Mexico

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2009年 / 80卷 / 10期

关键词：

SCANNING CAPACITANCE; MICROSCOPY; SAMPLE; PROBE;

D O I：

10.1063/1.3239406

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We analyze the determination of the dielectric constant of macroscopic solid samples in a nondestructive way from measurements of the capacitance between a pointer electrode and the sample's surface. We assembled an experimental device and found that an accuracy of 1% or better can be attained with common laboratory instrumentation. (C) 2009 American Institute of Physics. [doi:10.1063/1.3239406]

引用

页数：3

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