Single-shot digital phase-shifting Moire patterns for 3D topography

被引:8
作者
Guo, Haiyun [1 ]
Zhou, Haowen [1 ]
Banerjee, Partha P. [1 ]
机构
[1] Univ Dayton, Electroopt & Photon, Dayton, OH 45469 USA
关键词
3-DIMENSIONAL SHAPE MEASUREMENT; FRINGE PROJECTION PROFILOMETRY; STRUCTURED-LIGHT; MICROSCOPY; RECOGNITION; CALIBRATION; ABSOLUTE; SHADOW;
D O I
10.1364/AO.404424
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A simple and robust technique of Moire topography with single-image capture and incorporating digital filtering along with a four-step digitally implemented phase-shifting method is introduced for three-dimensional (3D) surface mapping. Feature details in the order of tens to hundreds of microns can be achieved using interferometrically generated structured light to illuminate the object surface. Compared to the traditional optical phase-shifting method, a digital phase-shifting method based on Fourier processing is implemented with computer-generated sinusoidal patterns derived from the recorded deformed fringes. This enables a single capture of the image that can be used to reconstruct the 3D topography of the surface. Single-shot imaging is simple to implement experimentally and avoids errors in introducing the correct phase shifts. The feasibility of this technique is verified experimentally, and applications to metallic surfaces are demonstrated. (C) 2020 Optical Society of America
引用
收藏
页码:A84 / A92
页数:9
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