Deterministic chaos in breakdown - Does it occur and what can it tell us?

被引：21

作者：

Dissado, LA ^{[1
]}

机构：

[1] Univ Leicester, Dept Engn, Leicester LE1 7RH, Leics, England

来源：

IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION | 2002年 / 9卷 / 05期

关键词：

D O I：

10.1109/TDEI.2002.1038662

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

It is shown that electrical breakdown mechanisms have a generic form that can exhibit deterministic chaos at sub-breakdown stresses, given a suitable parameter range. Calculation of temperature fluctuations in the thermal runaway mechanism is used to illustrate the behavior, and show the trends that may occur. Electrical tree propagation is used to outline the characteristics of deterministic chaos and to demonstrate its identification in an experimental sub-breakdown mechanism. The way in which this identification has been used to guide the development of a deterministic physical model for tree propagation is discussed. Some speculations are also made as to the possibility of using the properties of deterministic chaos for prediction, and on the relationship of deterministic chaos to cessation of activity prior to failure.

引用

页码：752 / 762

页数：11

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