Data-Driven Fault Localization of a DC Microgrid with Refined Data Input

被引:0
|
作者
Javed, Waqas [1 ,2 ]
Chen, Dong [1 ]
机构
[1] Glasgow Caledonian Univ, Dept Elect & Elect Engn, Glasgow, Lanark, Scotland
[2] Univ Engn & Technol, Dept Elect Engn, Rachna Campus, Lahore, Pakistan
来源
2020 IEEE 29TH INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS (ISIE) | 2020年
关键词
Low-voltage DC Microgrid; Fault localization; Data-driven; Data-refining; ANN; VOLTAGE-SOURCE-CONVERTER; LOCATION; STRATEGY;
D O I
10.1109/isie45063.2020.9152378
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper proposes an online fault localization method for low voltage DC microgrids. This method is based on Artificial Neural Network (ANN) and only requires real-time measurements of a local power converter to locate a fault. During a DC fault, the current component fed by the AC grid can contribute to time-variant non-linearity, which is undesirable to the development of the data-driven method. A novel real-time scheme is thus proposed to exclude such components from DC fault current. The principle of the scheme is introduced and illustrated with time-domain analysis. The effectiveness is verified by case studies of locating a DC fault in a radial DC network fed by a 3-phase voltage source converter.
引用
收藏
页码:1129 / 1134
页数:6
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