Estimation of genetic variability, heritability, and genetic advance in advanced lines for grain yield and yield components of sorghum [Sorghum bicolor (L.) Moench] at Humera, Western Tigray, Ethiopia

Sorghum [Sorghum bicolor (L.) Moench]'s production and productivity is by far lower than its potential. Knowledge on the extent and pattern of genetic variability is prerequisite important for generating superior varieties of different objectives for sorghum improvement. Therefore, this research was conducted to quantify genetic variability, heritability, and genetic advance as percent of mean (GAM). A total of 258 advanced lines including a local cultivar "Deber" were evaluated in 2016/17 at Humera Agricultural Research Center, Northern Ethiopia. Alpha lattice design was used with two replications and three blocks were nested within a replication. Experimental results revealed significant difference for yield and yield attributing traits among genotypes. Higher range of genotypic coefficient of variation (GCV) (3.13-37.44) and phenotypic coefficient of variation (PCV) (5.11-38.08) values were observed. Yield per panicle (YPP) (97%) and harvest index (HI) (31%) were the highest and lowest broad sense heritable (H-2)traits, respectively. Higher estimate of GAM observed for YPP (75.93%) followed by head weight (HW) (62.36%). Moreover, plant height (PH) (23.51, 83, and 44.22), YPP (37.44, 97, 75.93), HW (31.88, 89, 62.36), biomass (BM) (29.21, 74, 51.94), and grain yield (GY) (32.99, 78, 60.25) were traits with higher estimate of GCV, H-2 (%) and GAM, respectively. This study showed wider genetic variability in the tested genotypes. Therefore, hybridization ad selection on these genotypes for a desired traits with high (H-2) coupled with higher GCV and GAM will be effective to develop superior sorghum cultivars.