Suppress carrier recombination by introducing defects: The case of Si solar cell

被引:26
作者
Liu, Yuanyue [1 ]
Stradins, Paul [1 ]
Deng, Huixiong [2 ]
Luo, Junwei [2 ]
Wei, Su-Huai [1 ,3 ]
机构
[1] Natl Renewable Energy Lab, Golden, CO 80401 USA
[2] Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China
[3] Beijing Computat Sci Res Ctr, Beijing 100094, Peoples R China
关键词
LOW DIELECTRIC-CONSTANT; EFFICIENCY; INTERFACE; CONTACTS;
D O I
10.1063/1.4939628
中图分类号
O59 [应用物理学];
学科分类号
摘要
Deep level defects are usually harmful to solar cells. Here we show that incorporation of selected deep level defects in the carrier-collecting region, however, can be utilized to improve the efficiency of optoelectronic devices. The designed defects can help the transport of the majority carriers by creating defect levels that are resonant with the band edge state, and/or reduce the concentration of minority carriers through Coulomb repulsion, thus suppressing the recombination at the carrier-collecting region. The selection process is demonstrated by using Si solar cell as an example. Our work enriches the understanding and utilization of the semiconductor defects. (C) 2016 AIP Publishing LLC.
引用
收藏
页数:4
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