Energy-dispersive Laue diffraction by means of a frame-store pnCCD

被引：24

作者：

Send, Sebastian ^{[1
]}

von Kozierowski, Marc ^{[1
]}

Panzner, Tobias ^{[1
]}

Gorfman, Semen ^{[2
]}

Nurdan, Kivanc ^{[1
]}

Walenta, Albert H. ^{[1
]}

Pietsch, Ullrich ^{[1
]}

Leitenberger, Wolfram ^{[3
]}

Hartmann, Robert ^{[4
]}

Strueder, Lothar ^{[1
,5
,6
]}

机构：

[1] Univ Siegen, Dept Phys, D-57068 Siegen, Germany

[2] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England

[3] Univ Potsdam, Dept Phys, Potsdam, Germany

[4] PNSensor GmbH, Munich, Germany

[5] Max Planck Inst Halbleiterlabor, Munich, Germany

[6] Max Planck Inst Extraterr Phys, D-37075 Garching, Germany

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2009年 / 42卷

关键词：

X-RAY-DIFFRACTION; DETECTOR; RESOLUTION;

D O I：

10.1107/S0021889809039867

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A frame-store pn-junction CCD detector was applied to the energy-dispersive X-ray Laue diffraction study of a gamma-LiAlO2 crystal with white synchrotron radiation. Exploiting the simultaneous spatial and energy resolution of the detector the crystallographic unit cell of gamma-LiAlO2 could be determined without any a priori information about the sample. The potential for application in X-ray structure analysis is tested by comparing experimental structure factors taken under a single exposure with those calculated from the known crystal structure. After correcting the measured spot intensities by angular and energy-dependent parameters, the agreement between experimental and theoretical kinematical structure factors is better than 10%.

引用

页码：1139 / 1146

页数：8

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