Analysis of microstrip lines in multilayer structures of arbitrarily varying thickness

被引：17

作者：

Dreher, A ^{[1
]}

Ioffe, A ^{[1
]}

机构：

[1] DLR, Inst Radio Frequency Technol, D-82234 Wessling, Germany

来源：

IEEE MICROWAVE AND GUIDED WAVE LETTERS | 2000年 / 10卷 / 02期

关键词：

arbitrarily shaped interface; conformal; discrete mode matching; DMM; microstrip lines; multilayer;

D O I：

10.1109/75.843098

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A general approach to the full-wave analysis of microstrip lines in multilayer dielectrics of arbitrarily varying thickness is developed. It is based on the discrete mode matching technique (DMM) and uses a full-wave equivalent circuit for the stratified: structure, which is simple to apply in a numerical procedure, As an example, the propagation constant of a microstrip line in the interface of two dielectrics as a function of different shape characteristics is computed.

引用

页码：52 / 54

页数：3

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