Carbon nanotubes as tips in non-contact SFM

被引：33
作者：
Barwich, V
Bammerlin, M
Baratoff, A
Bennewitz, R
Guggisberg, M
Loppacher, C
Pfeiffer, O
Meyer, E
Güntherodt, HJ
Salvetat, JP
Bonard, JM
Forró, L
机构：
[1] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland
[2] Ecole Polytech Fed Lausanne, DP, Inst Genie Atom, CH-1015 Lausanne, Switzerland
来源：
APPLIED SURFACE SCIENCE | 2000年 / 157卷 / 04期
关键词：
carbon nanotube; tips; SFM;
D O I：
10.1016/S0169-4332(99)00538-3
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The demand for sharp and stable tips suggests the use of carbon nanotubes as probing tips in scanning force microscopy. Here, we report a comparison of the long-range forces of conventional tips and nanotube tips, topographical images of various surfaces, such as Cu(lll), Si(111)7 X 7 and NaCl(100), as well as images of a bundle of multiwalled nanotubes, which was deposited by severe tip crashing. It is found that the long-range forces of carbon nanotube probing tips are reduced and that they are more resistant to wear than conventional silicon tips (C) 2000 Elsevier Science B.V. All rights reserved.
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页码：269 / 273
页数：5
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