Carbon nanotubes as tips in non-contact SFM

被引:33
作者
Barwich, V
Bammerlin, M
Baratoff, A
Bennewitz, R
Guggisberg, M
Loppacher, C
Pfeiffer, O
Meyer, E
Güntherodt, HJ
Salvetat, JP
Bonard, JM
Forró, L
机构
[1] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland
[2] Ecole Polytech Fed Lausanne, DP, Inst Genie Atom, CH-1015 Lausanne, Switzerland
关键词
carbon nanotube; tips; SFM;
D O I
10.1016/S0169-4332(99)00538-3
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The demand for sharp and stable tips suggests the use of carbon nanotubes as probing tips in scanning force microscopy. Here, we report a comparison of the long-range forces of conventional tips and nanotube tips, topographical images of various surfaces, such as Cu(lll), Si(111)7 X 7 and NaCl(100), as well as images of a bundle of multiwalled nanotubes, which was deposited by severe tip crashing. It is found that the long-range forces of carbon nanotube probing tips are reduced and that they are more resistant to wear than conventional silicon tips (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:269 / 273
页数:5
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