共 50 条
- [1] Scaling Effects in Highly Scaled Commercial Nonvolatile Flash Memories 2012 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2012,
- [2] Accurate and Efficient Physical Simulation of Program Disturb in Scaled NAND Flash Memories 2013 14TH INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (ULIS), 2013, : 158 - 161
- [3] Enabling 3D NAND Trench Cells for Scaled Flash Memories 2023 IEEE INTERNATIONAL MEMORY WORKSHOP, IMW, 2023, : 121 - 124
- [4] RTN Impact on Data-Retention Failure/Recovery in Scaled (∼1Ynm) TLC NAND Flash Memories 2017 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2017,
- [8] Emerging SER modes and SEE testing strategies for highly scaled NAND FLASH devices 2005 Non-Volatile Memory Technology Symposium, Proceedings, 2005, : 140 - 140
- [10] Concatenated BCH Codes for NAND Flash Memories 2012 IEEE INTERNATIONAL CONFERENCE ON COMMUNICATIONS (ICC), 2012, : 2611 - 2616