Temperature dependent conductivity and dielectric properties of Bi2V0.9Cu0.1O5.35 solid electrolyte thin films

被引:16
作者
Nimat, R. K.
Joshi, R. S.
Pawar, S. H. [1 ]
机构
[1] Shivaji Univ, Dept Phys, Sch Energy Studies, Kolhapur 416004, Maharashtra, India
[2] Tatyasaheb Kore Inst Engn & Technol, Warananagar 416113, MS, India
来源
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 2007年 / 137卷 / 1-3期
关键词
BICUVOX; impedance spectroscopy; SOFC; conductivity; dielectric constant;
D O I
10.1016/j.mseb.2006.10.011
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Precursors of thin films were deposited on alumina substrates at temperature of 250 degrees C using spray pyrolysis technique and BICUVOX phase obtained after annealing at 650 degrees C. Thermal decomposition behavior of BICUVOX precursor was studied using TGA-DTA technique. It reveals that formation of oxide phase takes place beyond 630 degrees C. X-ray diffraction and SEM techniques were employed for structural and surface morphological characterizations, respectively. These studies reveal that the films are polycrystalline in nature and consist of the desired phase of Bi2V0.9Cu0.1O5.35 suitable for solid oxide fuel cells. The electrical conductivity and the dielectric properties of Bi2V0.9Cu0.1O5.35 thin films were investigated as a function of temperature (30-400 degrees C) in the frequency range 20 Hz to 1 MHz using impedance spectroscopy which reveals that the present electrolyte film can be used to form low temperature solid oxide fuel cells. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:93 / 98
页数:6
相关论文
共 26 条