Contactless measurement of giant magnetoresistance in thin films by infrared reflection

被引：18

作者：

Camplin, JP ^{[1
]}

Thompson, SM

Loraine, DR

Pugh, DI

Collingwood, JF

McCash, EM

Horn, AB

机构：

[1] Univ York, Dept Phys, York Y010 5DD, N Yorkshire, England

[2] Univ York, Dept Chem, York Y010 5DD, N Yorkshire, England

来源：

JOURNAL OF APPLIED PHYSICS | 2000年 / 87卷 / 09期

关键词：

D O I：

10.1063/1.373178

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The magnetorefractive effect (MRE) has been demonstrated in reflection for giant magnetoresistive Co30Ag70/Si(100) granular films, 400 and 1000 Angstrom thick. Measurements of infrared radiation in the 2-14 mu m range indicate a sensitivity to polarization of the incident light and an enhanced response at oblique angles of incidence. Direct correlation with dc magnetoresistance measurements has been demonstrated but computer simulations show that current theory is unable to satisfactorily model experimental observation. (C) 2000 American Institute of Physics. [S0021-8979(00)57808-6].

引用

页码：4846 / 4848

页数：3

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