Influence of barrier height and p-cladding layer on electroluminescent performance of AlGaN deep ultraviolet light-emitting diodes

被引:6
作者
Tan, S. [1 ]
Egawa, T. [2 ]
Luo, X. D. [1 ]
Sun, L. [1 ]
Zhu, Y. H. [1 ]
Zhang, J. C. [3 ]
机构
[1] Nantong Univ, Sch Elect & Informat, Nantong 226019, Peoples R China
[2] Nagoya Inst Technol, Res Ctr Nanodevice & Syst, Showa Ku, Gokiso Cho, Nagoya, Aichi 4668555, Japan
[3] Chinese Acad Sci, Suzhou Inst Nanotech & Nanobion, Platform Characterizat & Test, Suzhou 215123, Peoples R China
基金
中国国家自然科学基金;
关键词
deep ultraviolet light-emitting diodes; AlGaN; Electroluminescence; NM;
D O I
10.1088/0022-3727/49/12/125102
中图分类号
O59 [应用物理学];
学科分类号
摘要
The electroluminescent (EL) properties of AlGaN deep ultraviolet light-emitting diodes (DUV LEDs) are improved by increasing the Al composition of the barriers in the active region and decreasing the thickness of the p-cladding layer, respectively. Under 1.5 A cm(-2) direct current (DC) injection, the intensity of the parasitic peak around 320 nm is 43 times more than that of the band-to-band peak at 265 nm in the LED with a lower Al-composition (55%) barrier, while the parasitic peak is suppressed efficiently in the LED with a higher Al-composition (70%) barrier. By increasing the Al composition from 55% to 70% and decreasing the thickness of the p-cladding layer from 25 to 10 nm, the light output power of the DUV LEDs improved 305 and 61 times at DC injection of 1.5 and 15 A cm(-2), respectively. The band structure and the vertical conductivity were calculated. It was found that the increase of Al composition not only enhanced the barrier height for quantum wells but also decreased the barrier for hole injection. On the other hand, the thickness decrease of p-type cladding layers to some extent resulted in the improvement of both hole concentration and vertical tunneling conductivity. All of these contributed to the improvement of the EL properties of the LEDs.
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页数:5
相关论文
共 19 条
[1]   Performance Improvements for AlGaN-Based Deep Ultraviolet Light-Emitting Diodes With the p-Type and Thickened Last Quantum Barrier [J].
Bao, Xianglong ;
Sun, Pai ;
Liu, Songqing ;
Ye, Chunya ;
Li, Shuping ;
Kang, Junyong .
IEEE PHOTONICS JOURNAL, 2015, 7 (01)
[2]   Self-heating effects at high pump currents in deep ultraviolet light-emitting diodes at 324 nm [J].
Chitnis, A ;
Sun, J ;
Mandavilli, V ;
Pachipulusu, R ;
Wu, S ;
Gaevski, M ;
Adivarahan, V ;
Zhang, JP ;
Khan, MA ;
Sarua, A ;
Kuball, M .
APPLIED PHYSICS LETTERS, 2002, 81 (18) :3491-3493
[3]   282-nm AlGaN-based deep ultraviolet light-emitting diodes with improved performance on nano-patterned sapphire substrates [J].
Dong, Peng ;
Yan, Jianchang ;
Wang, Junxi ;
Zhang, Yun ;
Geng, Chong ;
Wei, Tongbo ;
Cong, Peipei ;
Zhang, Yiyun ;
Zeng, Jianping ;
Tian, Yingdong ;
Sun, Lili ;
Yan, Qingfeng ;
Li, Jinmin ;
Fan, Shunfei ;
Qin, Zhixin .
APPLIED PHYSICS LETTERS, 2013, 102 (24)
[4]   Room-temperature direct current operation of 290 nm light-emitting diodes with milliwatt power levels [J].
Fischer, AJ ;
Allerman, AA ;
Crawford, MH ;
Bogart, KHA ;
Lee, SR ;
Kaplar, RJ ;
Chow, WW ;
Kurtz, SR ;
Fullmer, KW ;
Figiel, JJ .
APPLIED PHYSICS LETTERS, 2004, 84 (17) :3394-3396
[5]  
Hirayama H., 2015, Electronics and Communications in Japan, V98, P1443
[6]   Ultraviolet light-emitting diodes based on group three nitrides [J].
Khan, Asif ;
Balakrishnan, Krishnan ;
Katona, Tom .
NATURE PHOTONICS, 2008, 2 (02) :77-84
[7]   Deep- ultraviolet AlGaN light- emitting diodes with variable quantum well and barrier widths [J].
Kim, Su Jin ;
Kim, Tae Geun .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2014, 211 (03) :656-660
[8]   Performance and Reliability of Deep-Ultraviolet Light-Emitting Diodes Fabricated on AlN Substrates Prepared by Hydride Vapor Phase Epitaxy [J].
Kinoshita, Toru ;
Obata, Toshiyuki ;
Nagashima, Toru ;
Yanagi, Hiroyuki ;
Moody, Baxter ;
Mita, Seiji ;
Inoue, Shin-ichiro ;
Kumagai, Yoshinao ;
Koukitu, Akinori ;
Sitar, Zlatko .
APPLIED PHYSICS EXPRESS, 2013, 6 (09)
[9]   Advances in group III-nitride-based deep UV light-emitting diode technology [J].
Kneissl, M. ;
Kolbe, T. ;
Chua, C. ;
Kueller, V. ;
Lobo, N. ;
Stellmach, J. ;
Knauer, A. ;
Rodriguez, H. ;
Einfeldt, S. ;
Yang, Z. ;
Johnson, N. M. ;
Weyers, M. .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2011, 26 (01)
[10]   Improved brightness of 380 nm GaN light emitting diodes through intentional delay of the nucleation island coalescence [J].
Koleske, DD ;
Fischer, AJ ;
Allerman, AA ;
Mitchell, CC ;
Cross, KC ;
Kurtz, SR ;
Figiel, JJ ;
Fullmer, KW ;
Breiland, WG .
APPLIED PHYSICS LETTERS, 2002, 81 (11) :1940-1942