Carbon nanotube tip for scanning tunneling microscopy

被引：22
|
作者：
Shingaya, Y
Nakayama, T
Aono, M
机构：
[1] RIKEN, Inst Phys & Chem Res, Wako, Saitama 3510198, Japan
[2] Japan Sci & Technol Corp, CREST, Kawaguchi, Saitama 3320012, Japan
[3] Osaka Univ, Dept Precis Sci & Technol, Suita, Osaka 5650871, Japan
来源：
PHYSICA B-CONDENSED MATTER | 2002年 / 323卷 / 1-4期
关键词：
carbon nanotubes; scanning tunneling microscopy; chemical vapor deposition;
D O I：
10.1016/S0921-4526(02)00885-2
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
We have developed a technique to prepare carbon nanotube (CNT) tip for scanning tunneling microscopy (STM). Using chemical vapor deposition, CNTs were directly grown from electrochemically etched tungsten tip. The STM images were routinely obtained for Si(1 1 1)7 x 7 surface with an atomic resolution using CNT tips as well as conventional metal tip. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：153 / 155
页数：3
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