Amorphization behaviors in polycrystalline alumina irradiated with energetic iodine ions

被引:31
作者
Aruga, T [1 ]
Katano, Y [1 ]
Ohmichi, T [1 ]
Okayasu, S [1 ]
Kazumata, Y [1 ]
机构
[1] Japan Atom Energy Res Inst, Tokai Res Estab, Dept Mat Sci, Tokai, Ibaraki 3191195, Japan
关键词
amorphization; polycrystalline alumina; ion irradiation; electronic stopping; fluidization;
D O I
10.1016/S0168-583X(99)00800-9
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A cross-sectional transmission electron microscopy (XTEM) technique utilized in examining the sintered alumina (Al2O3) sample irradiated by 85.0 MeV iodine ions I7+ to 2.8 x 10(18) m(-2) reveals that almost complete amorphization lakes place up to depths around 2 mu m. Several grains including grains about to be fading out at depths of 2.5-3.5 mu m are seen to have moved from the yet-amorphized region leaving the amorphized region behind. The amorphized regions extend up to depths around 4.5 mu m for the sample irradiated to 12 x 10(18) m(-2). Any defect clusters cannot be observed in grains located at depths around 8 mu m, where nuclear energy depositions are predicted to peak to about 1 dpa. The present results clearly demonstrate that the energy depositions through electronic process in alumina irradiated with heavy ions like present I7+ transform the crystalline phase into amorphous ones even near room temperatures, for accumulated electronic energy depositions above some 1.5-2 GGy with deposition rates above 4-5 keV/nm/ion. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:913 / 919
页数:7
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