Structural and Photoluminescent Studies of Eu3+-Doped Sr2SiO4 Phosphor

Here, we report the synthesis of Sr2-xEuxSiO4 (Sr2SiO4:Eu3+) [x = 0.01, 0.015, 0.02, 0.025, 0.03] silicate phosphors via high-temperature solid-state reaction method. The prepared phosphors were X-ray diffraction (XRD) characterized, and the analysis of XRD data conveyed that all the samples are crystalline, single-phased and have crystallized to orthorhombic structure (Pmnb). The structure, space group (Pmnb) and other structure concerned parameters were further verified using Rietveld refinement for x = 0.01 phosphor. The XRD pattern for all the synthesized phosphors was identical in appearance, and there is no evidence of the new peak with increased doping of Eu3+ ion. This behavior may be attributed to the uniform distribution of rare earth Eu3+ ion at Sr2+ site due to comparative ionic size of the host and guest ion. The formation of Sr2SiO4:Eu3+ phosphors is verified further by FTIR spectroscopic technique. To investigate optical band gap of prepared phosphors, UV-Vis diffuse reflectance spectroscopic studies have been carried out. Photoluminescence property of Sr2SiO4:Eu3+ phosphors was studied. The emission spectrum displayed characteristic emission peaks corresponding to Eu3+ around 587, 612 and 702 nm. The Commission International de I'Eclairage color coordinates were found lying in orange-red region.