Comprehensive frequency-dependent substrate noise analysis using boundary element methods

被引：14

作者：

Li, HM ^{[1
]}

Carballido, J ^{[1
]}

Yu, HH ^{[1
]}

Okhmatovski, VI ^{[1
]}

机构：

[1] Univ Illinois, Urbana, IL 61801 USA

来源：

IEEE/ACM INTERNATIONAL CONFERENCE ON CAD-02, DIGEST OF TECHNICAL PAPERS | 2002年

关键词：

D O I：

10.1109/ICCAD.2002.1167506

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

We present a comprehensive methodology for the electrodynamic modeling of substrate noise coupling. A new and efficient method is introduced for the calculation of the Green's function that can accommodate arbitrary substrate doping profiles and thus facilitate substrate noise analysis using boundary element methods. In addition to a discussion of the application of the method and its validation in the context of substrate transfer resistance extraction, preliminary results from its application to frequency-dependent substrate noise modeling are presented also.

引用

页码：2 / 9

页数：8

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