A CMOS ISFET interface circuit with dynamic current temperature compensation technique

被引:32
|
作者
Chan, P. K. [1 ]
Chen, D. Y. [1 ]
机构
[1] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore
关键词
CMOS circuit; ion-sensitive field-effect transistor (ISFET) interface circuit; ISFET sensor; temperature compensation; zero temperature coefficient; THRESHOLD VOLTAGE;
D O I
10.1109/TCSI.2006.887977
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a new ion-sensitive field-effect transistor (ISFET) readout circuit including a novel nonlinear temperature compensation method that is based on the theoretical work for formulating a body-effect-based ISFET drain current expression, the derivation of an unified temperature-dependent ISFET threshold voltage expression, and the use of iterative method for solving design parameters in nonlinear equations. Regarding the basic readout circuit, it comprises only one Source follower and one current source to establish a self-biased configuration for a single ISFET device. Due to elimination of body effect, it displays linear transfer characteristic in the experimental result. Incorporating temperature compensation further improves the thermal stability of the ISFET device in pH sensing function. This has been validated by the experimental results on pH values ranging from 4 to 9 in a temperature range of 22 degrees C to 50 degrees C from the measurement setup. The pH7 parameter is used as a reference in the method. The proposed works are attractive in terms of circuit simplicity, temperature-compensated performance, cost and compatibility for smart sensor operation.
引用
收藏
页码:119 / 129
页数:11
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