Large-tilt Heavy Ions Induced SEU in Multiple Radiation Hardened 22 nm FDSOI SRAMs

被引：2

作者：

Cai, Chang ^{[1
,3
]}

Liu, Tianqi ^{[1
]}

Liu, Jie ^{[1
]}

Chen, Gengsheng ^{[2
]}

Ding, Luchang ^{[2
]}

Zhao, Kai ^{[2
]}

Ning, Bingxu ^{[2
]}

Shen, Mingjie ^{[2
]}

Cai, Chang ^{[1
,3
]}

机构：

[1] Chinese Acad Sci, Inst Modern Phys, Lanzhou, Peoples R China

[2] Fudan Univ, State Key Lab ASIC & Syst, Shanghai, Peoples R China

[3] Univ Chinese Acad Sci, Sch Nucl Sci & Technol, Beijing, Peoples R China

来源：

2020 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) | 2020年

基金：

中国国家自然科学基金;

关键词：

Radiation hardened; Heavy ions; UTBB FDSOI; SRAM; SEU;

D O I：

10.1109/irps45951.2020.9128357

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Four kinds of radiation hardened SRAM were fabricated based on a 22 nm UTBB FDSOI process and irradiated by high-energy heavy ions. The high SEU tolerance and even SEU immunity for the three DICE SRAMs were investigated in vertical heavy-ion irradiation. However, the large-tilt-incidence (75 degrees-85 degrees) significantly increased the SEU cross sections for the 8-T SRAMs, and the errors in M-DICE and C-DICE hardened SRAMs in large tilt incidence were observed as well, indicating that the layout placement is essential. The UTBB FDSOI process contributes substantially to realize high SEU tolerance. While considering the existence of 4p-distributed relativistic heavy ions in space, the large-tilt irradiation is also indispensable in ground evaluation especially for the high reliable systems.

引用

页数：5

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