X-ray diffraction measurements in KCl shocked along [100]

被引:0
|
作者
d'Almeida, T [1 ]
Gupta, YM [1 ]
机构
[1] Washington State Univ, Inst Shock Phys, Pullman, WA 99164 USA
来源
SHOCK COMPRESSION OF CONDENSED MATTER-1999, PTS 1 AND 2 | 2000年 / 505卷
关键词
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Real time x-ray diffraction measurements were used to examine the polymorphic phase transformation in KCI shocked along the [100] direction. Shock wave continuum data, obtained previously by Hayes, were used to design the experiments and to predict diffraction from KCI shocked to different peak stresses. Here, we present the results obtained below the transition stress: between 1.4 and 2 GPa. Diffraction data obtained were quantitatively related to macroscopic compression. Interplanar spacing measurements revealed isotropic compression of the unit cell in contrast to previously reported results. Above the transition stress, descriptions of the atomic arrangement with respect to shock propagation (not available in the literature) are required for setting up the detection system. Hence, continuum results in combination with various crystallographic considerations were utilized to obtain data above the transition stress.
引用
收藏
页码:113 / 116
页数:4
相关论文
共 50 条
  • [1] Real-time x-ray diffraction measurements of the phase transition in KCl shocked along [100]
    d'Almeida, T
    Gupta, YM
    PHYSICAL REVIEW LETTERS, 2000, 85 (02) : 330 - 333
  • [2] Time-resolved x-ray diffraction measurements on CdS shocked along the c axis
    d'Almeida, T
    Di Michiel, M
    Kaiser, M
    Buslaps, T
    Fanget, A
    JOURNAL OF APPLIED PHYSICS, 2002, 92 (03) : 1715 - 1717
  • [3] Temperature measurements of shocked crystals by use of nanosecond X-ray diffraction
    Murphy, William J.
    Higginbotham, Andrew
    Wark, Justin S.
    Parkt, Nigel
    SHOCK COMPRESSION OF CONDENSED MATTER - 2007, PTS 1 AND 2, 2007, 955 : 325 - +
  • [4] Real-time x-ray diffraction measurements of shocked polycrystalline tin and aluminum
    Morgan, Dane V.
    Macy, Don
    Stevens, Gerald
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2008, 79 (11):
  • [5] X-ray diffraction measurements to determine longitudinal and transverse lattice deformation in shocked LiF
    Rigg, PA
    Gupta, YM
    SHOCK COMPRESSION OF CONDENSED MATTER-1999, PTS 1 AND 2, 2000, 505 : 1051 - 1056
  • [6] NANOSECOND X-RAY DIFFRACTION IN SHOCKED SOLID MATERIALS
    MITCHELL, AC
    JOHNSON, Q
    KEELER, RN
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1969, 14 (08): : 833 - &
  • [7] X-ray diffraction and continuum measurements in silicon crystals shocked below the elastic limit
    Turneaure, Stefan J.
    Gupta, Y. M.
    APPLIED PHYSICS LETTERS, 2007, 90 (05)
  • [8] WIDE ANGLE X-RAY DIFFRACTION FOR SHOCKED PERICLASE
    Hironaka, Y.
    Shigemori, K.
    Kadono, T.
    Fujioka, S.
    Tanabe, M.
    Shiroshita, A.
    Ozaki, N.
    Miyanishi, K.
    Kondo, T.
    Otani, K.
    Sakaiya, T.
    Shimizu, K.
    SHOCK COMPRESSION OF CONDENSED MATTER - 2009, PTS 1 AND 2, 2009, 1195 : 607 - 610
  • [9] Picosecond X-ray diffraction studies of shocked single crystals
    Wark, J. S.
    Belak, J. K.
    Collins, G. W.
    Colvin, J. D.
    Davies, H. M.
    Duchaineau, M.
    Eggert, J. H.
    Germann, T. C.
    Hawreliak, J.
    Higginbotham, A.
    Holian, B. L.
    Kadau, K.
    Kalantar, D. H.
    Lomdahl, P. S.
    Lorenzana, H. E.
    Meyers, M. A.
    Murphy, W.
    Park, N.
    Remington, B. A.
    Rosolankova, K.
    Rudd, R. E.
    Schneider, M. S.
    Sheppard, J.
    Stolken, J. S.
    HIGH-POWER LASER ABLATION VI, PTS 1 AND 2, 2006, 6261
  • [10] Pulsed X-ray diffraction structure study of shocked materials
    Podurets, A. M.
    PHYSICS-USPEKHI, 2011, 54 (04) : 408 - 415