Elements of Statistical SPICE Models

被引：0

作者：

Lu, Ning ^{[1
]}

Watts, Josef ^{[1
]}

Springer, Scott K. ^{[1
]}

机构：

[1] IBM Semicond Res & Dev Ctr, Syst & Technol Grp, Essex Jct, VT 05452 USA

来源：

NANOTECH CONFERENCE & EXPO 2009, VOL 3, TECHNICAL PROCEEDINGS: NANOTECHNOLOGY 2009: BIOFUELS, RENEWABLE ENERGY, COATINGS FLUIDICS AND COMPACT MODELING | 2009年

关键词：

SPICE modeling; statistical modeling; circuit simulation; asymmetric distribution;

D O I：

暂无

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

We discuss several elements of statistical SPICE models and present our solutions. We present (i) a solution of automatically detecting Monte Carlo vs. skewed Simulations, (ii) a method of modeling an arbitrarily given asymmetric or symmetric distribution, (iii) a hierarchical structure of the skewing parameters of many process/device statistical distributions for skewed simulations, (iv) a technique of combining chip-mean and across-chip variations for a single model parameter, (v) a method of correctly combining a chip-mean variation and an across-chip variation which is characterized as a percentage, and (vi) a method of enabling Monte Carlo simulations of across-chip variations at a skew corner of the chip-mean variations. These solutions establish a solid foundation for a good statistical SPICE model.

引用

页码：616 / 619

页数：4

共 10 条

[1]

LU N, 2008, P NSTI NAN WORKSH CO, V3, P818

[2]

LU N, 2008, P 9 INT S QUAL EL DE, P543

[3]

LU N, 2007, P NSTI NAN WORKSH CO, V3, P566

[4] Statistical and corner modeling of interconnect resistance and capacitance [J].

Lu, Ning .

PROCEEDINGS OF THE IEEE 2006 CUSTOM INTEGRATED CIRCUITS CONFERENCE, 2006, :853-856

[5]

Lu N, 2007, ISQED 2007: PROCEEDINGS OF THE EIGHTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, P743

[6]

McAndrew C. C., 2002, P 5 INT C MOD SIM MI, P715

[7]

MCANDREW CC, 2006, P NSTI NAN WCM BOST, P698

[8]

MCANDREW CC, 2004, P NSTI NAN WORKSH CO, P86

[9] Modeling of variation in submicrometer CMOS ULSI technologies [J].

Springer, Scott K. ;

Lee, Sungjae ;

Lu, Ning ;

Nowak, Edward J. ;

Plouchart, Jean-Olivier ;

Watts, Josef S. ;

Williams, Richard Q. ;

Zamdmer, Noah .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 2006, 53 (09) :2168-2178

[10]

WATTS J, 2005, P NSTI NAN C TRAD SH, V3, P87

← 1 →