Measurement-based method to characterize parasitic parameters of the integrated power electronics modules

被引：62

作者：

Yang, Liyu ^{[1
]}

Odendaal, Willem G. Hardus

机构：

[1] N Carolina State Univ, Semicond Power Elect Ctr, Raleigh, NC 27695 USA

[2] Virginia Polytech Inst & State Univ, Bradley Dept Elect & Comp Engn, Natl Sci Fdn, Engn Res Ctr Power Elect Syst, Blacksburg, VA 24061 USA

来源：

IEEE TRANSACTIONS ON POWER ELECTRONICS | 2007年 / 22卷 / 01期

基金：

欧洲研究理事会; 美国国家科学基金会;

关键词：

characterization; common-mode (CM); differential mode (DM); electromagnetic compatibility (EMC); electromagnetic interference (EMI); integrated power electronics modules (IPEMs); measurement; noise; packaging; parasitic capacitance; parasitic inductors;

D O I：

10.1109/TPEL.2006.886615

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A measurement-based method for extracting the parasitic parameters of active power electronics modules (IPEMs) is proposed. Parasitic inductances and capacitances inside the IPEM can all be extracted using this method without destroying the structure. The linearized model is derived from impedance measurement and it is valid from low frequency to frequencies as high as 100 MHz. Extracted parameters are compared to those from commercial software and the results are in good agreement. A parallel resonance method is proposed for the characterization of commonmode capacitances.

引用

页码：54 / 62

页数：9