Investigation of high extraction efficiency flip-chip GaN-based light-emitting diodes

被引:1
|
作者
Da XiaoLi [1 ]
Shen GuangDi [1 ]
Xu Chen [1 ]
Zou DeShu [1 ]
Zhu YanXu [1 ]
Zhang JianMing [1 ]
机构
[1] Beijing Univ Technol, Inst Elect Informat & Control Engn, Beijing Optoelect Technol Lab, Beijing 100124, Peoples R China
来源
SCIENCE IN CHINA SERIES F-INFORMATION SCIENCES | 2009年 / 52卷 / 08期
关键词
GaN; light emitting diodes; SiO2/SiNx dielectric film reflectors; plasma enhanced chemical vapor deposition; SURFACE; OUTPUT; IMPROVEMENT; POWER;
D O I
10.1007/s11432-009-0048-2
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In order to obtain higher light output power, the flip-chip structure is used. We studied the ratio of the light of GaN sides before and after fabricating metal reflector on p-GaN. The SiO2/SiN (x) dielectric film reflectors were deposited through plasma enhance chemical vapor deposition following the fabrication of metal reflector, and then the dielectric film reflectors on the electrodes were etched in order to expose the electrodes to the air. It is found that comparing with the flip-chip GaN-LED without dielectric film reflectors, light output power can be increased by as high as 10.2% after the deposition of 2 pairs of SiO2/SiN (x) dielectric film reflectors on GaN-LEDs, which cover the sidewalls and the areas without the metal reflector. This result indicates that the high reflector formed by multi-layer dielectric films is useful to enhance the light output power of GaN-based LED, which reflects light from step sidewalls and p-GaN without metal reflector to internal, and then light emits from the surface.
引用
收藏
页码:1476 / 1482
页数:7
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