Construction of a grazing incidence x-ray reflection system for liquid-vapor interfaces by use of an imaging plate

被引：12

作者：

Yano, YF ^{[1
]}

Iijima, T ^{[1
]}

机构：

[1] Gakushuin Univ, Dept Chem, Toshima Ku, Tokyo 1718588, Japan

来源：

JOURNAL OF CHEMICAL PHYSICS | 2000年 / 112卷 / 21期

关键词：

D O I：

10.1063/1.481577

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We have constructed a grazing incidence x-ray reflection system for liquid-vapor interfaces by use of an imaging plate as an area detector. The reflectivity data were obtained with high resolution even by use of a conventional x-ray tube. The surface reflectivity measurements for pure water, ethanol and 2-butoxyethanol were performed and the values of the surface roughness were obtained as 4.1 +/- 0.1, 7.1 +/- 0.3 and 6.2 +/- 0.2 Angstrom, respectively. For water, slight broadening of reflection peaks was observed. This was caused by the surface curvature due to the large surface tension. By fitting the reflection profiles, the radius of curvature was found to be nearly 100 m for water and ten times larger for ethanol and 2-butoxyethanol. (C) 2000 American Institute of Physics. [S0021-9606(00)70321-7].

引用

页码：9607 / 9616

页数：10

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