1.54 μm room temperature emission from Er-doped Si nanocrystals deposited by ECR-PECVD

in this work, silicon nanocrystals (Si-nc) embedded in a silicon-rich silicon oxide (SRSO) matrix doped with Er3+ ions for different erbium and silicon concentrations have been deposited by electron-cyclotron resonance plasma-enhanced chemical-vapor-deposition (ECR-PECVD) technique. Their optical properties have been investigated by photoluminescence (PL) and reflectance spectroscopy. Room temperature emission bands centered at similar to 1.54 and at 0.75 mu m have been obtained for all samples. The most intense emission band at similar to 1.54 mu m was obtained for samples with concentrations of 0.45% and 39% for erbium and silicon, respectively. Moreover, it has been found that the broad emission band centered at similar to 0.75 mu m for all samples shows a very strong interference pattern related to the a specific sample structure and a high sample quality. (c) 2006 Elsevier B.V. All rights reserved.