An approach to consistent jitter modeling for various jitter aspects and measurement methods

被引:38
作者
Shimanouchi, M [1 ]
机构
[1] Schlumberger Semicond Solut, San Jose, CA 95134 USA
来源
INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS | 2001年
关键词
D O I
10.1109/TEST.2001.966707
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Timing jitter, period jitter, long term jitter, jitter spectrum, SSB phase noise, etc. These terms have been used to describe various aspects of jitter phenomena. While several jitter measurement techniques have been proposed with the associated jitter models and modeling techniques, the relationship among various jitter aspects, and therefore, the relationship among various jitter measurement techniques is not very obvious, This paper analytically clarifies their relationship, and reviews several jitter measurement techniques based on the results of our analytical studies.
引用
收藏
页码:848 / 857
页数:10
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