Resonance properties and mass sensitivity of monolithic microcantilever sensors actuated by piezoelectric PZT thick film

被引:10
作者
Park, Jae Hong
Kwon, Tae Yun
Kim, Hyung Joon
Kim, Seung Rae
Yoon, Dae Sung [1 ]
Cheon, Chae-Il
Kim, Hwan
Kim, Tae Song
机构
[1] Korea Inst Sci & Technol, Microsyst Res Ctr, Seoul 136791, South Korea
[2] Seoul Natl Univ, Div Mat Sci & Engn, Seoul 151744, South Korea
[3] Yonsei Univ, Dept Ceram Engn, Seoul 120749, South Korea
[4] Hoseo Univ, Dept Mat Sci & Engn, Cheonan 336795, South Korea
关键词
cantilever; resonance; sensitivity; PZT; tick film;
D O I
10.1007/s10832-006-6290-8
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The PZT thick film cantilever devices fabricated via MEMS process have much attraction because they are appropriate for biological transducer or sensor, resulting from their large actuating force and relatively high sensitivity especially in liquid. By means of resonance behavior, theoretical calculation and experimental verification of the PZT thick film cantilever devices have not been studied before. Accordingly, we focused on the sensitivity analysis and interpretation of the PZT thick film cantilevers in this study. Especially, the investigation for mass sensitivity of the PZT thick film cantilever is of importance for physical, chemical and biological sensing application. The PZT thick film cantilever devices were constructed on Pt/TiO2/SiNX/Si substrates using screen printing method and MEMS process. The harmonic oscillation response (resonance frequency) was measured using an optical laser interferometric vibrometer. The effect of cantilever geometry on the resonance frequency change was investigated. Compared with the theoretical resonant frequency change by mass loading, the experimental resonant frequency change of the PZT micromechanical thick film cantilever shows a variation of less than 2%. Mass sensitivities are estimated to be 30.7, 57.1 and 152.0 pg/Hz for the 400 x 380 mu m, 400 x 480 mu m and 400 x 580 mu m cantilever, respectively.
引用
收藏
页码:565 / 572
页数:8
相关论文
共 13 条
[1]   Processing of PZT piezoelectric thick films on silicon for microelectromechancial systems [J].
Beeby, SP ;
Blackburn, A ;
White, NM .
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 1999, 9 (03) :218-229
[2]   Silicon micromachining processes combined with thick-film printed lead zirconate titanate actuators for microelectromechanical systems [J].
Beeby, SP ;
Blackburn, A ;
White, NM .
MATERIALS LETTERS, 1999, 40 (04) :187-191
[3]   An investigation of self-powered systems for condition monitoring applications [J].
James, EP ;
Tudor, MJ ;
Beeby, SP ;
Harris, NR ;
Glynne-Jones, P ;
Ross, JN ;
White, NM .
SENSORS AND ACTUATORS A-PHYSICAL, 2004, 110 (1-3) :171-176
[4]   Fabrication of PZT thick films on silicon substrates for piezoelectric actuator [J].
Jeon, Y ;
Chung, JS ;
No, K .
JOURNAL OF ELECTROCERAMICS, 2000, 4 (01) :195-199
[5]   PZT thin films for piezoelectric microactuator applications [J].
Kueppers, H ;
Leuerer, T ;
Schnakenberg, U ;
Mokwa, W ;
Hoffmann, M ;
Schneller, T ;
Boettger, U ;
Waser, R .
SENSORS AND ACTUATORS A-PHYSICAL, 2002, 97-8 :680-684
[6]   Investigation of factors affecting the preparation of PZT thick films [J].
Le Dren, S ;
Simon, L ;
Gonnard, P ;
Troccaz, M ;
Nicolas, A .
MATERIALS RESEARCH BULLETIN, 2000, 35 (12) :2037-2045
[7]   Effect of mass and stress on resonant frequency shift of functionalized Pb(Zr0.52Ti0.48)O3 thin film microcantilever for the detection of C-reactive protein [J].
Lee, JH ;
Kim, TS ;
Yoon, KH .
APPLIED PHYSICS LETTERS, 2004, 84 (16) :3187-3189
[8]   Characterization of resonant behavior and sensitivity using micromachined PZT cantilever [J].
Lee, JH ;
Yoon, KH ;
Kim, TS .
INTEGRATED FERROELECTRICS, 2002, 50 :43-52
[9]   Piezoelectric cantilever beams actuated by PZT sol-gel thin film [J].
Luginbuhl, P ;
Racine, GA ;
Lerch, P ;
Romanowicz, B ;
Brooks, KG ;
deRooij, NF ;
Renaud, P .
SENSORS AND ACTUATORS A-PHYSICAL, 1996, 54 (1-3) :530-535
[10]  
Merhaut J., 1981, THEORY ELECTROACOUST, P100