Data processing for serial crystallography: recent developments in CrystFEL

被引：0
|
作者：
White, Thomas A. [1 ]
机构：
[1] Deutsch Elektronen Synehrotron DESY, Ctr Free Electron Laser Sci, Hamburg, Germany
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2015年 / 71卷
关键词：
XFEL; serial femtosecond crystallography; data processing;
D O I：
10.1107/S205327331509974X
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS2-O2
引用
收藏
页码：S15 / S15
页数：1
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