The Effect on Switching Lifetime of Chromium Adhesion Layers in Gold-Coated Electrical Contacts under Cold and Hot Switching Conditions

被引:0
|
作者
Lewis, A. P. [1 ]
Down, M. P. [1 ]
Chianrabutra, C. [1 ]
Jiang, L. [1 ]
Spearing, S. M. [1 ]
McBride, J. W. [2 ]
机构
[1] Univ Southampton, Electromech Engn, Southampton SO17 1EN, Hants, England
[2] Univ Southampton, Nusajaya 79200, Johor, Malaysia
来源
PROCEEDINGS OF 2013 IEEE 59TH HOLM CONFERENCE ON ELECTRICAL CONTACTS (HOLM) | 2013年
关键词
Electrical contacts switching lifetime; adhesion layers; failure mechanisms; modelling failure;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Gold is commonly used for electrical contacts due to its many desirable electrical and mechanical properties. Throughout the switch lifetime, the contacts are required to survive a large number of opening and closing cycles and therefore it is important to understand the failure mechanisms. Adhesion layers (e.g. chromium or titanium) can be deposited to increase the adhesion of the gold layer to the contact surface. In this work, the inclusion of a chromium adhesion layer shows an improvement of the switching lifetime of gold-coated electrical contacts under cold and hot switching conditions. These testing conditions further the understanding of the failure mechanisms (e.g. fine transfer, etc.). The mechanism of failure when no chromium adhesion layer was used is attributed to delamination of the gold layer from one contact to the other. This failure mechanism is different in the cases where a chromium adhesion layer is included. We present a model which was developed in line with experimental results. These describe the effect of load current on material transfer between gold contacts and the contact failure.
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页数:7
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