Polarization state and Mueller matrix measurements in terahertz-time domain spectroscopy

被引：38

作者：

Dong, Hui ^{[1
]}

Gong, Yandong ^{[1
]}

Paulose, Varghese ^{[1
]}

Hong, Minghui ^{[2
]}

机构：

[1] Inst Infocomm Res, Singapore 138632, Singapore

[2] Data Storage Inst, Singapore 117608, Singapore

来源：

OPTICS COMMUNICATIONS | 2009年 / 282卷 / 18期

关键词：

Terahertz-time domain spectroscopy; Polarization state measurement; Mueller matrix measurement; ELECTROMAGNETIC-RADIATION; PHOTOCONDUCTIVE ANTENNA;

D O I：

10.1016/j.optcom.2009.06.035

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We derive the complete formulae governing the polarization state measurement in terahertz-time domain spectroscopy (THz-TDS) by using a rotatable THz polarizer. Four Stokes parameters can be uniquely obtained by spectrally-resolved measurement in THz-TDS. Further, we propose a new approach to measure the Mueller matrix of a pure birefringent material, using THz-TDS, by rotating the material under test. Based on the above techniques, we successfully measured the Mueller matrices of a quartz crystal in the frequency domain. (c) 2009 Elsevier B.V. All rights reserved.

引用

页码：3671 / 3675

页数：5

共 18 条

[1] An ion-implanted InP receiver for polarization resolved terahertz spectroscopy [J].