The effect of structural defects on magnetic switching in thin ferromagnetic patterned films

被引：1

作者：

Chang, Ching-Ray ^{[1
]}

Yang, Jyh-Shinn

机构：

[1] Natl Taiwan Univ, Dept Phys, Taipei 10617, Taiwan

[2] Natl Taiwan Ocean Univ, Inst Optoelect Sci, Chilung 20224, Taiwan

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2007年 / 43卷 / 02期

关键词：

magnetic switching; micromagnetic simulations; patterned films; structural defects;

D O I：

10.1109/TMAG.2006.888515

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We have utilized micromagnefic simulations to study the effect of structural defects on the magnetic switching behavior of thin elliptical permalloy films. The nonmagnetic void was found to tend to pin the adjacent magnetic moment, which changes the local equilibrium magnetization configurations and alters the switching behavior of magnetization, leading to a large variation in switching fields. In particular, for the case of voids close to the edge, the curling effect of voids is significant and induces the occurrence of the multiple-stage magnetization reversal, leading to significantly large switching fields.

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收藏

页码：923 / 926

页数：4

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