Influence of pixel topology on performances of CMOS APS imagers

被引:1
作者
Magnan, P [1 ]
Gautrand, A [1 ]
Degerli, Y [1 ]
Marques, C [1 ]
Lavernhe, F [1 ]
Cavadore, C [1 ]
Corbière, F [1 ]
Farré, J [1 ]
Saint-Pé, O [1 ]
Tulet, M [1 ]
Davancens, R [1 ]
机构
[1] SUPAERO, CIMI Grp, Toulouse, France
来源
SENSORS AND CAMERA SYSTEMS FOR SCIENTIFIC, INDUSTRIAL AND DIGITAL PHOTOGRAPHY APPLICATIONS | 2000年 / 3965卷
关键词
active pixel sensor; APS; CMOS; image sensors; characterization; electro-optic performances;
D O I
10.1117/12.385429
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This paper describes a 128x128 pixels prototype array organized as sub-arrays of 32x32 pixels each, with 21 mu m pixel pitch. The sub-arrays, photodiode or photogate based, are implemented using a standard 0.7 mu m CMOS process. Various topologies of the photosensitive area have been implemented and some of them have an optical metal shield over the so-called non-sensitive area to evaluate the contribution of the active electronic area to the responsivity of the sensor. A synthesis of the measurements carried out by CIMI-SUPAERO and MMS, addressing darkness parameters, noise, photometric and radiometric performances, are presented with emphasis on the photogate type pixels. Results of spot-scan analysis and crosstalk measurements performed on selected topologies are also reported. Several samples were irradiated at different proton doses and their related behavior is discussed. From these results, a new 512x512 pixels array has been designed for space applications. The main features of this APS device are presented here.
引用
收藏
页码:114 / 125
页数:12
相关论文
共 9 条
[1]  
AGWANI S, 1999, P 1999 IEEE WORKSH C, P21
[2]   Determination of the conversion gain and the accuracy of its measurement for detector elements and arrays [J].
Beecken, BP ;
Fossum, ER .
APPLIED OPTICS, 1996, 35 (19) :3471-3477
[3]   Design and characterization of CMOS APS imagers on two different technologies [J].
Cavadore, C ;
Solhusvik, J ;
Magnan, P ;
Gautrand, A ;
Degerli, Y ;
Lavernhe, F ;
Farre, J ;
Saint-Pe, O ;
Davancens, R ;
Tulet, M .
SOLID STATE SENSOR ARRAYS: DEVELOPMENT AND APPLICATIONS II, 1998, 3301 :140-150
[4]  
DEGERLI Y, IN PRESS IEEE T ELEC
[5]   CMOS image sensors: Electronic camera-on-a-chip [J].
Fossum, ER .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1997, 44 (10) :1689-1698
[6]   Experimental characterization of CMOS APS imagers designed using two different technologies. [J].
Magnan, P ;
Cavadore, C ;
Gautrand, A ;
Degerli, Y ;
Lavernhe, F ;
Farré, J ;
Saint-Pé, O ;
Davancens, R ;
Tulet, M .
ADVANCED FOCAL PLANE ARRAYS AND ELECTRONIC CAMERAS II, 1998, 3410 :77-87
[7]   CMOS active pixel image sensors for highly integrated imaging systems [J].
Mendis, SK ;
Kemeny, SE ;
Gee, RC ;
Pain, B ;
Staller, CO ;
Kim, QS ;
Fossum, ER .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1997, 32 (02) :187-197
[8]   Recent experimental results from a CMOS active pixel image sensor with photodiode and photogate pixels [J].
Solhusvik, J ;
Cavadore, C ;
Audoux, FX ;
Verdier, N ;
Farre, J ;
StPe, O ;
Davancens, R ;
David, JP .
ADVANCED FOCAL PLANE ARRAYS AND ELECTRONIC CAMERAS, 1996, 2950 :18-24
[9]   Technology and device scaling considerations for CMOS imagers [J].
Wong, HS .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1996, 43 (12) :2131-2142