Direct writing of silicon nanostructures using liquid-phase electron beam induced deposition of hydrosilanes

被引:3
作者
Masuda, Takashi [1 ,2 ,3 ]
Mori, Masahiro [1 ]
机构
[1] Japan Adv Inst Sci & Technol, Sch Mat Sci, Nomi, Ishikawa 9231292, Japan
[2] Cucullus Inc, 1-18 Chuo Dori, Kanazawa, Ishikawa 9200866, Japan
[3] Verein Artworker Org, A-1080 Vienna, Austria
关键词
liquid silicon; semiconductor; electron beam induced deposition; thin film; hydrosilane;
D O I
10.1088/1361-6528/abe0e9
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Solid Si (wafer) and gaseous Si (silane) are generally used as starting materials for fabricating Si devices. In this study, a liquid precursor (liquid-phase hydrosilane) for semiconducting Si, called liquid Si (liq-Si), was synthesized to establish a liquid pathway for fabricating Si. Although the liquid-to-solid Si conversion can be induced by heating at 400 degrees C, conversion without heating was realized herein by electron-beam (EB) irradiation. This study is the first to irradiate liq-Si with EB. Size-controllable Si nanodots, with diameters of the order of 100 nm, were directly deposited at any point by liquid-phase electron-beam-induced deposition (LP-EBID) with a beam diameter of 50 nm. This approach yielded less-contaminated deposits at the detection limit of energy-dispersive x-ray spectroscopy, as opposed to typical EBID, wherein carbon impurities up to 90% are found. The processing resolution of LP-EBID is potentially 1 nm or less. Therefore, this non-heating deposition technique realizes the direct writing of Si nanostructures and would be a powerful tool for Si nanofabrication.
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页数:7
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