Physical and electrical properties of molybdenum thin films grown by DC magnetron sputtering for photovoltaic application

被引:37
作者
Rashid, Haroon [1 ,2 ]
Rahman, Kazi Sajedur [3 ]
Hossain, Mohammad Istiaque [4 ]
Nasser, Ammar Ahmed [3 ]
Alharbi, Fahhad H. [6 ,7 ]
Akhtaruzzaman, Md. [5 ]
Amin, Nowshad [1 ,3 ]
机构
[1] Natl Univ Malaysia, Univ Kebangsaan Malaysia, Fac Engn & Built Environm, INTEGRA, Bangi 43600, Selangor, Malaysia
[2] Univ Malaya, Photon Res Ctr, Kuala Lumpur 50603, Malaysia
[3] Natl Energy Univ, Univ Tenaga Nas, Inst Sustainable Energy, Jalan IKRAM UNITEN, Kajang 43000, Selangor, Malaysia
[4] Qatar Fdn, Qatar Environm & Energy Res Inst, Doha, Qatar
[5] Natl Univ Malaysia, Univ Kebangsaan Malaysia, Solar Energy Res Inst, Bangi 43600, Selangor, Malaysia
[6] King Fahd Univ Petr & Minerals, Elect Engn Dept, Dhahran, Saudi Arabia
[7] KA CARE Energy Res & Innovat Ctr, Dhahran, Saudi Arabia
关键词
Thin films; Molybdenum; Sputtering; FESEM; XRD; Refractive index; BACK CONTACT; SOLAR-CELLS; MICROSTRUCTURE; SULFIDE; STRAIN; LAYER; RESISTIVITY; SUBSTRATE; PROSPECTS; ADHESION;
D O I
10.1016/j.rinp.2019.102515
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
DC magnetron sputtering was utilized to grow thin layers of molybdenum (Mo) on top of soda lime glass substrates. Deposition power was varied for suitable characteristics of films grown at various DC powers, i.e. 100 W, 150 W and 200 W. Thin Mo film of approximately 580 nm thickness was successfully grown at DC power of 100 W at room temperature. Structural, morphological, electrical and optical properties of Mo thin films were analyzed. XRD patterns revealed Mo films to be monocrystalline in nature and only one peak was observed corresponding to the (1 1 0)(cub) reflection plane at 2 theta = 40.5 degrees. Exceptionally dense microstructure was found for surface morphology observation by AFM and FESEM. Increasing deposition power resulted in coarser surface of the grown films. The minimum average surface roughness was found to be around 0.995 nm. Scotch tape adhesion test was performed to validate adhesion. Grown Mo films were found metallic in nature with electrical resistivity of 2.64 x 10(-5) Omega-cm. Furthermore, it was found that by increasing deposition power, the electrical resistivity could further be reduced.
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页数:7
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