Influence of Ni2+ Substitution for Zn2+ on Microwave Dielectric Properties of Zn1-xNixZrNb2O8 Ceramics

被引:2
作者
Xiao, Mi [1 ]
Zhang, Peng [1 ]
Sun, Hongrui [1 ]
Zhou, Ziqi [1 ]
Zhang, Ping [1 ]
机构
[1] Tianjin Univ, Sch Elect & Informat Engn, Minist Educ, Key Lab Adv Ceram & Machining Technol, Tianjin 300072, Peoples R China
基金
中国国家自然科学基金;
关键词
Microwave dielectric properties; bond ionicity; lattice energy; bond energy; CRYSTAL-STRUCTURE; LATTICE ENERGY; BOND IONICITY;
D O I
10.1007/s11664-019-07449-3
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Dependence of microwave dielectric properties on the crystal structure of Zn1-xNixZrNb2O8 was investigated as a function of NiO content (x = 0, 0.02, 0.04, 0.06, 0.08). Pure single phase with monoclinic wolframite structure was obtained through solid-state reacti. The unit-cell volume of the specimens decreased with NiO content because of the smaller ionic radius of Ni2+ than Zn2+. Dielectric constant (K) of the sintered specimen was affected by bond-ionicity. Quality factor (Q x f(0)) was analyzed depending on the lattice-energy. With the increase of Ni2+, temperature coefficient of resonant frequency (tau(f)) of specimens increased due to the increase of B-site bond energy. The sample of Zn1-xNixZrNb2O8 (x = 0.08) sintered at 1250 degrees C for 4 h showed excellent microwave dielectric properties, epsilon(r) of 25.72, Q x f(0) value of 73224 GHz, and tau(f) of - 39.14 ppm/degrees C.
引用
收藏
页码:6553 / 6560
页数:8
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