Highly reliable oxide VCSELs manufactured at HP/Agilent Technologies

被引：3

作者：

Herrick, RW ^{[1
]}

Lim, SF ^{[1
]}

Deng, H ^{[1
]}

Deng, Q ^{[1
]}

Dudley, JJ ^{[1
]}

Keever, MR ^{[1
]}

Oh, T ^{[1
]}

Li, M ^{[1
]}

Tashima, M ^{[1
]}

Hodge, LA ^{[1
]}

Zhang, X ^{[1
]}

Herniman, J ^{[1
]}

Evans, P ^{[1
]}

Liang, B ^{[1
]}

Lei, C ^{[1
]}

机构：

[1] Agilent Technol, San Jose, CA 95131 USA

来源：

VERTICAL-CAVITY SURFACE-EMITTING LASERS IV | 2000年 / 3946卷

关键词：

VCSEL; vertical cavity surface emitting laser; reliability; oxide aperture; laser degradation;

D O I：

10.1117/12.384365

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We discuss the reliability of the oxide VCSELs made by Agilent Technologies (formerly part of Hewlett Packard). Measurements of operating temperature in fiber optic modules are given; these temperatures are higher than generally assumed. General challenges with oxide VCSEL reliability are introduced, and different types of failures are discussed. Long-term oxide VCSEL lifetest results are presented, along with observations about the thermal and current acceleration models. Production monitoring strategies are discussed, and the basic degradation phenomenology is briefly shown.

引用

页码：14 / 19

页数：6

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