Fusion of 2-D SIMS images using the wavelet transform

Secondary ion mass spectroscopy (SIMS) is a powerful method for element distribution examination of conducting and semi-conducting surfaces at high spatial resolution and with a high sensitivity. Routine surface analysis produces about 8 to 15 images in a short time, each of which displays the intensity distribution of one mass, thus generating a multispectral SIMS image. Formation of occlusions, segregations, and the overall location of the elements relative to each ether, are difficult to recognise when looking at n separate 2-D images. Image fusion is a process whereby images obtained from various sensors. or at different moments of time, or under different conditions, are combined together to provide a more complete picture of the object under investigation. The process of combining SIMS images may be viewed as an attempt to compensate for the inherent effect of SIMS to channel the information obtained from the sample into different images, corresponding to different element phases. The wavelet transform is a powerful method for fusion of images. This work covers the use of wavelet based fusion algorithms on multispectral SIMS images, evaluating the performance of different wavelet based fusion rules on different type of image systems and comparing the results to conventional fusion techniques. An aim of this study is to increase the information, i.e. the number of masses, which can be merged into one image in order to enhance the perception and interpretation of the SIMS surface images.