Buckling characterization of vertical ZnO nanowires using nanoindentation

被引:86
|
作者
Ji, Liang-Wen [1 ]
Young, Sheng-Joue
Fang, Te-Hua
Liu, Chien-Hung
机构
[1] Natl Formosa Univ, Inst Electroopt & Mat Sci, Yunlin 632, Taiwan
[2] Natl Cheng Kung Univ, Inst Microelect, Tainan 701, Taiwan
[3] Natl Cheng Kung Univ, Dept Elect Engn, Tainan 701, Taiwan
关键词
D O I
10.1063/1.2431785
中图分类号
O59 [应用物理学];
学科分类号
摘要
Nanomechanical characterization of vertical well-aligned single-crystal ZnO nanowires on ZnO:Ga/glass templates was performed by nanoindentation technique. The buckling loads were found to be 1465 and 215 mu N for the ZnO nanowires of 100 and 30 nm diameters, respectively. Furthermore, the buckling energies for the ZnO nanowires of 100 and 30 nm diameters were 3.62x10(-10) and 3.69x10(-11) J, respectively. Based on the Euler buckling model, Young's modulus of the individual ZnO nanowire has been derived from two possible modes in this work. (c) 2007 American Institute of Physics.
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页数:3
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