Spatially resolved measurements of the ferromagnetic phase transition by ac-susceptibility investigations with x-ray photoelectron emission microscope

被引：2

作者：

Roemer, F. M. ^{[1
,2
]}

Kronast, F. ^{[3
]}

Heyne, L. ^{[4
]}

Hassel, C. ^{[1
,2
]}

Banholzer, A. ^{[1
,2
]}

Klaeui, M. ^{[4
]}

Meckenstock, R. ^{[1
,2
]}

Lindner, J. ^{[1
,2
]}

Farle, M. ^{[1
,2
]}

机构：

[1] Univ Duisburg Essen, Dept Phys, D-47048 Duisburg, Germany

[2] Univ Duisburg Essen, Ctr Nanointegrat CeNIDE, D-47048 Duisburg, Germany

[3] Helmholtz Zentrum Berlin, D-12489 Berlin, Germany

[4] Univ Konstanz, Dept Phys, D-78457 Constance, Germany

来源：

APPLIED PHYSICS LETTERS | 2010年 / 96卷 / 12期

关键词：

Curie temperature; ferromagnetic materials; ferromagnetic-paramagnetic transitions; iron; magnetic epitaxial layers; magnetic susceptibility; paramagnetic materials; X-ray photoelectron spectra; MAGNETIZATION; ABSORPTION; MONOLAYERS; FILMS;

D O I：

10.1063/1.3360205

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Spatially resolved ac susceptibility measurements on epitaxial Fe films are performed as a function of temperature using a conventional soft-x-ray photoelectron emission microscope. A magnetic contrast is observed at sample locations where the magnetic film undergoes a para/ferromagnetic phase transition. Due to the wedge structure of the Fe film and the thickness dependence of the Curie temperature the spatial extend of the phase transition region and the correlation length can be estimated.

引用

页数：3

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