High-precision displacement measurement method for three degrees of freedom-compliant mechanisms based on computer micro-vision

被引:19
作者
Wu, Heng [1 ]
Zhang, Xianmin [1 ]
Gan, Jinqiang [1 ]
Li, Hai [1 ]
He, Zhenya [1 ]
机构
[1] S China Univ Technol, Sch Mech & Automot Engn, Guangdong Prov Key Lab Precis Equipment & Mfg Tec, Guangzhou 510640, Guangdong, Peoples R China
基金
中国国家自然科学基金;
关键词
DIGITAL IMAGE CORRELATION; CLASSIFICATION; ALGORITHM;
D O I
10.1364/AO.55.002594
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A practical method for the high-precision displacement measurements of the three degrees of freedom-compliant mechanisms based on computer micro-vision is proposed. The method consists of two steps. In the first step, the candidate pixels are selected using a ring projection transform matching approach. In the second step, the exact location is determined by an improved pseudo-Zernike moment method. The setup of the micro-vision system is also introduced. A series of simulations is carried out and the results show that the proposed algorithm enjoys extremely high precision and robustness in the presence of image translations and rotations. Finally, a microvision system and a laser interferometer measurement (LIM) system are built up to validate and compare the actual performances of the proposed method. The experimental results demonstrate that the proposed approach can obtain a high accuracy and shows higher operability and stability than the LIM system. Moreover, the measuring accuracy can reach a pixel. (C) 2016 Optical Society of America
引用
收藏
页码:2594 / 2600
页数:7
相关论文
共 32 条
[1]   A simple evolutionary topology optimization procedure for compliant mechanism design [J].
Ansola, Ruben ;
Vegueria, Estrella ;
Canales, Javier ;
Tarrago, Jose A. .
FINITE ELEMENTS IN ANALYSIS AND DESIGN, 2007, 44 (1-2) :53-62
[2]   Optical methods for distance and displacement measurements [J].
Berkovic, Garry ;
Shafir, Ehud .
ADVANCES IN OPTICS AND PHOTONICS, 2012, 4 (04) :441-471
[3]   Template matching using fast normalized cross correlation [J].
Briechle, K ;
Hanebeck, UD .
OPTICAL PATTERN RECOGNITION XII, 2001, 4387 :95-102
[4]   A Novel Algorithm for Radar Classification Based on Doppler Characteristics Exploiting Orthogonal Pseudo-Zernike Polynomials [J].
Clemente, Carmine ;
Pallotta, Luca ;
De Maio, Antonio ;
Soraghan, John J. ;
Farina, Alfonso .
IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS, 2015, 51 (01) :417-430
[5]   Pixel-level robust digital image correlation [J].
Cofaru, Corneliu ;
Philips, Wilfried ;
Van Paepegem, Wim .
OPTICS EXPRESS, 2013, 21 (24) :29979-29999
[6]   A compact low-stiffness six degrees of freedom compliant precision stage [J].
Dunning, A. G. ;
Tolou, N. ;
Herder, J. L. .
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2013, 37 (02) :380-388
[7]   Design for Assembly Guidelines for High-Performance Compliant Mechanisms [J].
Gandhi, Prasanna ;
Sonawale, Kaustubh ;
Soni, Vaibhav ;
Patanwala, Naved ;
Bansode, Arvind .
JOURNAL OF MECHANICAL DESIGN, 2012, 134 (12)
[8]   Variants of dense descriptors and Zernike moments as features for accurate shape-based image retrieval [J].
Goyal, Anjali ;
Walia, Ekta .
SIGNAL IMAGE AND VIDEO PROCESSING, 2014, 8 (07) :1273-1289
[9]   Development of a grating-based interferometer for six-degree-of-freedom displacement and angle measurements [J].
Hsieh, Hung-Lin ;
Pan, Ssu-Wen .
OPTICS EXPRESS, 2015, 23 (03) :2451-2465
[10]   A new method for characterizing nonlinearity in scanning probe microscopes using digital image correlation [J].
Jin, H ;
Bruck, HA .
NANOTECHNOLOGY, 2005, 16 (09) :1849-1855