Microstructure and strain relaxation in YBa2Cu3O7/PrBa2Cu3-xGaxO7 superlattices.

被引:3
作者
Contour, JP
Drouet, M
Durand, O
Maurice, JL
Gauzzi, A
机构
[1] THOMSON CSF,LCR,F-91404 ORSAY,FRANCE
[2] ECOLE SUPER PHYS & CHIM IND VILLE PARIS,F-75231 PARIS,FRANCE
来源
PHYSICA C | 1997年 / 282卷
关键词
D O I
10.1016/S0921-4534(97)00499-1
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present X-ray diffraction and transmission electron microscopy observations of microstructure and strain relaxation in YBa2Cu3O7/PrBa2Cu3-xGaxO7 (X = 0.2) superlattices. This work follows a previous study on the influence of strain on the transition width Delta T-c in these systems [1].
引用
收藏
页码:689 / 690
页数:2
相关论文
共 7 条
[1]   PREFERRED ALIGNMENT OF TWIN BOUNDARIES IN YBA2CU3OX THIN-FILMS AND YBA2CU3OX/PRBA2CU3OX SUPERLATTICES ON SRTIO3 [J].
BUDAI, JD ;
CHISHOLM, MF ;
FEENSTRA, R ;
LOWNDES, DH ;
NORTON, DP ;
BOATNER, LA ;
CHRISTEN, DK .
APPLIED PHYSICS LETTERS, 1991, 58 (19) :2174-2176
[2]  
CONTOUR JP, 1996, SPIE, V2697, P339
[3]   TEMPERATURE-DEPENDENCE OF THE PENETRATION DEPTH IN EPITAXIAL Y1BA2CU3O7-X THIN-FILMS [J].
GASPAROV, VA ;
OGANESYAN, AP .
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 1991, 178 (4-6) :445-448
[4]  
GAUZZI A, 1996, SPIE, V2697, P361
[5]   STRUCTURE, PROPERTIES AND APPLICATIONS OF GEXSI1-X STRAINED LAYERS AND SUPERLATTICES [J].
JAIN, SC ;
HAYES, W .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1991, 6 (07) :547-576
[6]  
LOCQUET JP, 1996, ICSC F 96
[7]  
MATTHEWS JW, 1975, EPITAXIAL GROWTH, pC48