Two-dimensional semiconductor HfSe2 and MoSe2/HfSe2 van der Waals heterostructures by molecular beam epitaxy

被引:116
作者
Aretouli, K. E. [1 ]
Tsipas, P. [1 ]
Tsoutsou, D. [1 ]
Marquez-Velasco, J. [1 ]
Xenogiannopoulou, E. [1 ]
Giamini, S. A. [1 ]
Vassalou, E. [1 ]
Kelaidis, N. [1 ]
Dimoulas, A. [1 ]
机构
[1] Natl Ctr Sci Res Demokritos, Inst Nanosci & Nanotechnol, Athens 15310, Greece
关键词
INTEGRATED-CIRCUITS; THIN-FILMS; MOSE2;
D O I
10.1063/1.4917422
中图分类号
O59 [应用物理学];
学科分类号
摘要
Using molecular beam epitaxy, atomically thin 2D semiconductor HfSe2 and MoSe2/HfSe2 van der Waals heterostructures are grown on AlN(0001)/Si(111) substrates. Details of the electronic band structure of HfSe2 are imaged by in-situ angle resolved photoelectron spectroscopy indicating a high quality epitaxial layer. High-resolution surface tunneling microscopy supported by first principles calculations provides evidence of an ordered Se adlayer, which may be responsible for a reduction of the measured workfunction of HfSe2 compared to theoretical predictions. The latter reduction minimizes the workfunction difference between the HfSe2 and MoSe2 layers resulting in a small valence band offset of only 0.13 eV at the MoSe2/HfSe2 heterointerface and a weak type II band alignment. (C) 2015 AIP Publishing LLC.
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页数:5
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