Thickness measurements with use of the eddy-current method

被引:0
|
作者
Dziczkowski, Leszek [1 ]
机构
[1] Politech Slaska, Inst Elect, PL-44100 Gliwice, Poland
来源
PRZEGLAD ELEKTROTECHNICZNY | 2011年 / 87卷 / 11期
关键词
thickness gauge; non-destructive tests; eddy currents; microprocessor systems; electric metrology;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The paper deals with the idea how to efficiently measure thickness of thin sheets and foils made of electrically conductive non-ferromagnetic materials. The measurement method based on application of eddy currents seems to be an interesting alternative when the examined foil or coating is accessible only from one side or the foil or coating is covered with another non-conductive material. The proposed method consists in automatic adjustment of frequency for the excitation current and in the original calibration process that can be carried out with use of patters. (Thickness measurements with use of the eddy-current method).
引用
收藏
页码:178 / 182
页数:5
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