Identification of surface optical phonon in wurtzite InN epitaxial thin films by coherent phonon spectroscopy

被引：14

作者：

Chang, Y-M. ^{[1
]}

Chu, H. W.

Shen, C-H.

Gwo, S.

机构：

[1] Natl Taiwan Univ, Inst Condensed Matter Sci, Taipei 106, Taiwan

[2] Natl Tsing Hua Univ, Dept Phys, Hsinchu 300, Taiwan

来源：

APPLIED PHYSICS LETTERS | 2007年 / 90卷 / 07期

关键词：

D O I：

10.1063/1.2679358

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Coherent phonon spectroscopy of wurtzite InN epitaxial thin films was carried out with time-resolved second-harmonic generation technique. In addition to the bulk A(1)(LO) phonon and A(1)(LO)-plasmon coupling modes, a phonon mode at 543 cm(-1) was identified and characterized. It is found that this phonon mode is localized in the topmost few atomic layers and sensitive to surface modification. This vibration mode is described as the opposite motion between the In and N atoms along the c axis. This phonon mode is assigned to the surface optical phonon of InN. (c) 2007 American Institute of Physics.

引用

页数：3

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