A sub-micron metallic electrothermal gripper

被引:10
|
作者
Park, Daniel Sang-Won [2 ]
Nallani, Arun Kumar [2 ]
Cha, DonKyu [2 ]
Lee, Gil-Sik [2 ]
Kim, Moon J. [2 ]
Skidmore, George [3 ]
Lee, Jeong-Bong [2 ]
Lee, Jeong-Soo [1 ,2 ]
机构
[1] Pohang Univ Sci & Technol, Dept Elect & Elect Engn, Pohang 790784, Kyungbuk, South Korea
[2] Univ Texas Dallas, Erik Jonsson Sch Engn & Comp Sci, Richardson, TX 75083 USA
[3] Zyvex Corp, Richardson, TX 75081 USA
来源
MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS | 2010年 / 16卷 / 03期
关键词
SU-8;
D O I
10.1007/s00542-009-0939-6
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report the design, fabrication, and characterization of a multiple bent beam, sub-micron metallic electrothermal gripper. A bottom electroplating mold for electrodes was patterned using electron beam lithography in an SU-8, followed by nickel electroplating. A top electroplating mold for a sub-micron metallic gripper with high aspect ratio bent beams (thickness of 1 mu m, width of 350 nm) was prepared using electron beam lithography in a polymethyl methacrylate (PMMA), followed by nickel electroplating and dry release of the top and bottom molds. The sub-micron gripper was characterized using a nanomanipulator system installed in a dual column scanning electron microscopy/focused ion beam system. The ability of the jaw to close up to 1.39 mu m displacement with high precision and reliability has been reproducibly observed at an applied current of 28 mA, corresponding to the maximum power consumption of 11.2 mW. Finite element modeling displacement results performed using ANSYS for effective bent beam widths of 370 nm showed a good agreement with the measured displacement results. The sub-micron gripper demonstrated herein will enable the reproducible manipulations with nano-scale resolution displacement and could provide an effective means of interface between nano-scale objects and the micro/macro scale robotic systems.
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页码:367 / 373
页数:7
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